To provide a drop tester capable of performing a drop test of electronic equipment repeatedly in a short time in an optional attitude.

This drop tester comprises a guide shaft installed vertically; a fixing guide for holding a specimen and a drop part on a prescribed height position of the guide shaft, the drop part dropping together with the specimen along the guide shaft separately from the fixing guide; and a collision plate with which the specimen collides. Since the drop part is equipped with an attitude holding means for holding the attitude of the specimen on the back side in the dropping direction of the specimen, the drop test of the electronic equipment can be performed repeatedly in a short time in an optional attitude.