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Title:
DRY ETCHING METHOD
Document Type and Number:
Japanese Patent JPH03155622
Kind Code:
A
Abstract:

PURPOSE: To form a surface to be etched into a mirror surface state without emulsification by selectively etching a silicon substrate in an anode coupling type dry etching apparatus using mixture gas of SF6 gas and O2 gas of a range having specific mixture ratio of O2 gas.

CONSTITUTION: Gas of mixture of sulfur hexafluoride as reaction gas with oxygen gas in a range of 6 to 15vol.% to the entire reaction gas is used. In a reaction tank 1, a lower electrode 2 as a stage and an upper electrode 3 are opposed. A discharge tube 4 provided dispersively at the peripheral edge of the bottom plate 11 of the tank 1 is provided toward the center of the electrode 2 parallel to its bottom plate. A silicon substrate 20 to be processed, formed with a mask pattern is mounted on the stage 2 of a dry etching apparatus, SF6 gas and O2 gas are fed from an inlet 7 as mixed reaction gas 8 while regulating its flow rate. A high frequency power is applied to the electrode 3 to generate a plasma 9 between the electrodes 2 and 3.


Inventors:
GOTOU TOMOAKI
Application Number:
JP5105490A
Publication Date:
July 03, 1991
Filing Date:
March 02, 1990
Export Citation:
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Assignee:
FUJI ELECTRIC CO LTD
International Classes:
H01L21/302; H01L21/3065; (IPC1-7): H01L21/302
Domestic Patent References:
JPS62250643A1987-10-31
Attorney, Agent or Firm:
Iwao Yamaguchi