Title:
低コヒーレンス光源を用いた動的光散乱測定法及び動的光散乱測定装置
Document Type and Number:
Japanese Patent JP5841475
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a dynamic light scattering measuring method employing a low coherence light source with which an average particle size of fine particles or the distribution thereof can be measured with high accuracy and through simple operation even in the case of a dispersion solution containing fine particles in high concentration, and a dynamic light scattering measuring device.SOLUTION: A dynamic light scattering measuring method is provided for measuring dynamic characteristics of fine particles Sdispersed in a dispersion solution S while using a Mach-Zehnder interferometer using low coherence light. According to the dynamic light scattering measuring method, in the dispersion solution S, the fine particles Sare irradiated with low coherence light, light scattered by the fine particles Sin the dispersion solution S is received for each of a plurality of different scattering angles θ as scattered light, and a translation/diffusion mode is selected and determined from a temporal correlation function of scattered light at each scattering angle θ.
Inventors:
Yuki Sato
Nakamura Takaichirou
Katsuhiro Ishii
Nakamura Takaichirou
Katsuhiro Ishii
Application Number:
JP2012072934A
Publication Date:
January 13, 2016
Filing Date:
March 28, 2012
Export Citation:
Assignee:
FUJIFILM Corporation
International Classes:
G01N15/02; G01N21/27
Domestic Patent References:
| JP2011013162A | ||||
| JP2096636A | ||||
| JP63012939A | ||||
| JP2002257727A | ||||
| JP2010101877A |
Foreign References:
| WO2004042371A1 | ||||
| WO2011091369A1 |
Attorney, Agent or Firm:
Toshizo Iida
Naosuke Miyamae
Naosuke Miyamae