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Title:
DYNAMIC LIGHT-SCATTERING MEASURING DEVICE USING LOW-COHERENCE LIGHT SOURCE AND METHOD OF MEASURING LIGHT-SCATTERING INTENSITY
Document Type and Number:
Japanese Patent JP2011013162
Kind Code:
A
Abstract:

To achieve dynamic light-scattering measurement for realizing measurement (measurement of a grain size, its aggregate state, or the like) relating to a highly precise grain size in a solution containing high-concentration fine particle containing minute particles, and also to provide a method of measuring dynamic light scattering.

A dynamic light-scattering measuring device has: a Mach-Zehnder interferometer; and a low-coherence light source. Also provided is a method of measuring light-scattering intensity of particles in a medium measured by light emitted from a low-coherence light source by using the measurement method of dynamic light-scattering by the Mach-Zehnder interferometer.


Inventors:
ISHII KATSUHIRO
NAKAMURA TAKAICHIRO
SATO YUKI
Application Number:
JP2009159307A
Publication Date:
January 20, 2011
Filing Date:
July 03, 2009
Export Citation:
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Assignee:
FUJIFILM CORP
International Classes:
G01N21/27; G01N15/02
Domestic Patent References:
JP2008039539A2008-02-21
JP2003106979A2003-04-09
JPH09159607A1997-06-20
JP2005121600A2005-05-12
Foreign References:
WO2009036418A12009-03-19
Other References:
BABU VARGHESE ET AL.: "“High angle phase modulated low coherence interferometry for path length resolved Doppler measureme", OPTICS COMMUNICATIONS, vol. 281, no. 3, JPN6013011112, 16 October 2007 (2007-10-16), pages 494 - 498, XP022383075, ISSN: 0002476915, DOI: 10.1016/j.optcom.2007.09.050
Attorney, Agent or Firm:
Toshizo Iida
Naosuke Miyamae