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Title:
DYNAMIC RESPONSE ANALYZING METHOD
Document Type and Number:
Japanese Patent JP2007024665
Kind Code:
A
Abstract:

To provide a sequential nonlinear dynamic response analyzing method in a frequency domain.

A linear response analysis is carried out in the frequency domain to obtain a response wave of an analysis model for every period unit in order of time series. An initial state and an initial value of a physical property are set as a first analysis condition in the analysis model, and an input wave which is an object wave to be analyzed, is subjected to the linear response analysis in the frequency domain, thereby obtaining a response wave in the first period unit. In the second period unit or subsequent ones, a wave to be input is obtained by using the linear response analysis in the frequency domain such that the wave to be input results in generating a response wave following the response wave obtained just before the corresponding period unit with respect to the object wave to be analyzed under the analysis condition just before the corresponding period unit, and the obtained wave is determined as the object wave to be analyzed. Then, the analysis condition of the corresponding period unit is set based on the response wave obtained just before the corresponding period unit, and the object wave to be analyzed in the corresponding period unit is subjected to the linear response analysis in the frequency domain, thereby obtaining the response wave of the corresponding period unit.


Inventors:
Ueda, Minoru
Nagasaka, Hideaki
Application Number:
JP2005000206547
Publication Date:
February 01, 2007
Filing Date:
July 15, 2005
Export Citation:
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Assignee:
CHUBU ELECTRIC POWER CO INC
NAGASAKA HIDEAKI
International Classes:
G01M7/02; G01V1/30