Title:
ECCENTRICITY CALCULATION DEVICE AND METHOD
Document Type and Number:
Japanese Patent JP2022176371
Kind Code:
A
Abstract:
To provide an eccentricity calculation device and method usable for calculating an eccentricity amount without relatively requiring labor.SOLUTION: An eccentricity calculation device (100) includes: radiating means (110) for radiating a terahertz wave (THz) to a sphere (500) including an outer layer (501) having an outer spherical surface (501s) and an inner layer (502) that has an inner spherical surface (502s) located inside the outer spherical surface and is located inside the outer layer; detecting means (130) for detecting the terahertz wave radiated to the sphere; and calculating means (401) for calculating the eccentricity amount (p) as a deviation amount between a center (c1) of the outer spherical surface and a center (c3) of the inner spherical surface on the basis of detection result of the terahertz wave by the detecting means.SELECTED DRAWING: Figure 4
Inventors:
Takahashi Kazuo
Application Number:
JP2022162177A
Publication Date:
November 25, 2022
Filing Date:
October 07, 2022
Export Citation:
Assignee:
Pioneer Corporation
International Classes:
G01B15/00
Attorney, Agent or Firm:
Tatsuo Egami
Nakamura Satoshi
Nakamura Satoshi
Previous Patent: JPWO2022176370
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