ECCENTRICITY MEASUREMENT METHOD AND DEVICE

Title:

ECCENTRICITY MEASUREMENT METHOD AND DEVICE

Document Type and Number:

Japanese Patent JP2005156469

Kind Code:

A

Abstract:

To provide an eccentricity measurement method capable of highly precisely measuring an aspheric eccentricity amount and an aspheric eccentricity direction of an aspheric lens even when an inclination of an aspheric axis is small in the aspheric surface.

A first area including an efficient diameter and a second area arranged in the outer circumferential part of the first area and provided with a larger aspheric amount than the first area are defined, and eccentricity of the aspheric lens is measured when the surface shape of the second area is measured.

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Inventors:

NAGAYAMA TSUTOMU

Application Number:

JP2003398173A

Publication Date:

June 16, 2005

Filing Date:

November 27, 2003

Export Citation:

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Assignee:

OLYMPUS CORP

International Classes:

G01B11/27; G01B21/24; G01M11/00; (IPC1-7): G01B21/24; G01B11/27; G01M11/00

Attorney, Agent or Firm:

Takehiko Suzue
Satoshi Kono
Sadao Muramatsu
Tetsuya Kazama

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