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Title:
渦電流探傷プローブ、探傷方法
Document Type and Number:
Japanese Patent JP7227794
Kind Code:
B2
Abstract:
To provide an eddy current flaw detection probe capable of inspecting curved parts more smoothly.SOLUTION: An eddy current flaw detection probe 100 includes: a probe head including a set coil that has an exciting coil and a detection coil; a tube 40 connected to the probe head; and circuit boards 61, 62, 63 provided in the tube 40. With this configuration, an eddy current flaw detection probe capable of inspecting the curved parts of a pipe more smoothly and a flaw detection method are achieved.SELECTED DRAWING: Figure 4

Inventors:
Eiji Tomita
Takashi Hasebe
Junichiro Nishida
Application Number:
JP2019038036A
Publication Date:
February 22, 2023
Filing Date:
March 01, 2019
Export Citation:
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Assignee:
MITSUBISHI HEAVY INDUSTRIES,LTD.
International Classes:
G01N27/90; G21C17/003; G21C17/013
Domestic Patent References:
JP2009074943A
JP10082765A
JP11083810A
Foreign References:
US5398560
Attorney, Agent or Firm:
Yasushi Matsunuma
Eisuke Ito
Hiroyuki Hashimoto
Ancient city Satoshi
Koichiro Kamada
Taichi Hasegawa



 
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