Title:
ELECTRIC CHARACTERISTIC TESTING DEVICE
Document Type and Number:
Japanese Patent JP3555315
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an electric characteristic testing device with the structure that enables the shortening of a test cycle by eliminating the need for standby time and positioning time before a circuit test.
SOLUTION: Grip mechanism 20 and 30 are arranged on the path of a flexible board 10 so as to sandwich the flexible board 10 from above and below. A test mechanism 40 is installed over the grip mechanism 20 and 30 so as to move up and down freely. The grip mechanisms 20 and 30 are installed on a movable mechanism and each consist of movable jaw-shaped parts 21, 22 and 31, 32 respectively which are constructed to move up and down. The testing head 41 of the test mechanism 40 disposed over a contact block is driven by a driving part 42 to move up and down.
Inventors:
Shigeki Tanaka
Katsutoyo Inoue
Katsutoyo Inoue
Application Number:
JP7373096A
Publication Date:
August 18, 2004
Filing Date:
March 28, 1996
Export Citation:
Assignee:
Seiko Epson Corporation
International Classes:
G01R31/26; G01R31/28; G04D7/00; (IPC1-7): G01R31/28; G01R31/26
Domestic Patent References:
| JP4083179A | ||||
| JP4320097A | ||||
| JP6232216A | ||||
| JP61159174A | ||||
| JP4036465U | ||||
| JP5095044U |
Attorney, Agent or Firm:
Masahiko Ueyanagi
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