Title:
ELECTRIC TEST SET FOR MICRO-WIRING AND ITS OPERATING METHOD
Document Type and Number:
Japanese Patent JPS5975163
Kind Code:
A
Abstract:
An arrangement for electrically testing microinterconnections with electric test contacts may be used given drastically-reduced dimensions of electric conductors and of the grid dimensions in printed circuitboards. The electric test contacts are selectable by way of internal switches. The test contacts can be disposed in a matrix whose grid dimension corresponds to the grid dimension of a printed circuitboard to be tested.
Inventors:
BURUKUHARUTO RISHIYUKE
YURUGEN FUROOJIEN
RAINHORUTO SHIYUMITSUTO
YURUGEN FUROOJIEN
RAINHORUTO SHIYUMITSUTO
Application Number:
JP17103483A
Publication Date:
April 27, 1984
Filing Date:
September 16, 1983
Export Citation:
Assignee:
SIEMENS AG
International Classes:
G01R31/02; G01R1/073; G01R31/28; (IPC1-7): G01R31/02
Attorney, Agent or Firm:
Tomimura Kiyoshi
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