Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
ELECTRIC WAVE IMAGE PROCESSING SYSTEM
Document Type and Number:
Japanese Patent JP2005077344
Kind Code:
A
Abstract:

To reduce the glint phenomenon by a simple system configuration to improve the detection rate of an object.

Transmitting systems 2 simultaneously irradiate an object to be measured with millimeter waves of frequencies of f1 to f3 at regular time intervals. Each millimeter wave reflected/scattered by the object to be measured is sequentially converged by a dielectric lens 3, is received by a receiving element 4, and then outputted to a signal processing system 5. The signal processing system 5 averages the signal intensity in the millimeter waves of frequencies of f1 to f3, and then outputs it to an output screen 6 as an image.


More Like This:
JP7247413ELECTRONIC DEVICE, ELECTRONIC DEVICE CONTROL METHOD, AND PROGRAM
JP6529462How and system to generate an image of the scene behind the wall
WO/2015/021792MILLIMETER WAVE THREE-DIMENSIONAL HOLOGRAPHIC SCAN IMAGING DEVICE AND INSPECTION METHOD FOR HUMAN BODY OR GOODS
Inventors:
KOYA SHIGEKI
KURITA NAOYUKI
KONDO HIROSHI
Application Number:
JP2003310916A
Publication Date:
March 24, 2005
Filing Date:
September 03, 2003
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
HITACHI LTD
International Classes:
G01S13/89; G01S13/38; (IPC1-7): G01S13/89; G01S13/38
Attorney, Agent or Firm:
Yamato Tsutsui



 
Previous Patent: METHOD OF EXPANDING MEASUREMENT RANGE OF OPTICAL SENSOR

Next Patent: DOUBLE-TANK FLOWMETER