To provide an EMI measuring device capable of measuring at what timing electromagnetic noise is generated at each measuring point of a digital device.

In an EMI measuring device for measuring near magnetic field in the vicinity of a circuit by moving a near magnetic field probe 4 to each measuring point of a digital device 1, provided are a moving device 5 moving the near magnetic field probe 4 to the measuring point in turn, a timing controller 2 making a timing device 1 perform predetermined sequence processing, a central controller measuring the near magnetic field by the near magnetic field probe 4 while the digital device 1 is executing the sequence processing. It is also constituted to detect the generation of interruption process in the digital device 1 and not to take in the measured results during the interruption process as the measured information of the near magnetic field.