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Title:
ELECTRON CAPTURE DETECTOR
Document Type and Number:
Japanese Patent JP2008232783
Kind Code:
A
Abstract:

To enable analysis of a sample of a low concentration by improving detection sensitivity.

The amount of a radiation source 16 that is a radioactive isotope element enclosed in a detection cell 11 is set in the range of not less than 20MBq and less than 100MBq that is lower than before, for instance, at 90MBq. Thus, the amount of free electrons generated following positive ionization of inert gas in the detection cell 11 is reduced, so that the change in the amount of electrons captured when an object substance (electrophilic molecule) to be detected of low concentration is introduced is more easily indicated in a detection signal and thus the detection sensitivity is improved.


Inventors:
TAKEMORI SUKENORI
Application Number:
JP2007071890A
Publication Date:
October 02, 2008
Filing Date:
March 20, 2007
Export Citation:
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Assignee:
SHIMADZU CORP
International Classes:
G01N27/64; G01N27/62; G01N30/70
Domestic Patent References:
JPH11153579A1999-06-08
JPH05215722A1993-08-24
JP2000065799A2000-03-03
JPH10111275A1998-04-28
JP2006131486A2006-05-25
Attorney, Agent or Firm:
Ryouhei Kobayashi