Title:
ELECTRONIC APPARATUS, DETERIORATION ESTIMATION SYSTEM FOR BUILT-IN POWER SOURCE, AND DETERIORATION ESTIMATION METHOD FOR BUILT-IN POWER SOURCE
Document Type and Number:
Japanese Patent JP2016090426
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an electronic apparatus capable of unerringly estimating a deterioration degree of a built-in power source of an electronic apparatus.SOLUTION: An electronic apparatus 1 is provided with a rechargeable built-in power source 24, a charging circuit 25 that supplies power supplied from an external power source B to the built-in power source 24, and a voltage measurement circuit 27 that measures a voltage V of the built-in power source 24. The electronic apparatus 1 is further provided with a temperature sensor T that measures a temperature T of the built-in power source 24, and an estimation circuit 29 that estimates the deterioration degree of the built-in power source 24. The estimation circuit 29 determines whether or not it is possible to perform deterioration estimation processing, which is for estimating the deterioration degree of the built-in power source 24, on the basis of the voltage V of the built-in power source 24 measured by the voltage measurement circuit 27 and the temperature T of the built-in power source 24 measured by the temperature sensor 28, and performs the deterioration estimation processing of the built-in power source 24 only when it is determined that the deterioration estimation processing of the built-in power source 24 can be performed.SELECTED DRAWING: Figure 6
Inventors:
IKEDA YUKI
EGUCHI YOSHIHIKO
EGUCHI YOSHIHIKO
Application Number:
JP2014225890A
Publication Date:
May 23, 2016
Filing Date:
November 06, 2014
Export Citation:
Assignee:
KONICA MINOLTA INC
International Classes:
G01R31/00; G01R31/36; G03B42/02; H01M10/48; H02J7/00
Domestic Patent References:
| JP2000295778A | 2000-10-20 | |||
| JP2000299137A | 2000-10-24 | |||
| JP2012235551A | 2012-11-29 | |||
| JP2000224701A | 2000-08-11 |
Foreign References:
| US20070252600A1 | 2007-11-01 |
Attorney, Agent or Firm:
Gwangyang International Patent Office