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Title:
ELECTRONIC CIRCUIT AND OVERHEAT DETECTION METHOD
Document Type and Number:
Japanese Patent JP2018129969
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To provide an electronic circuit and an overheat detecting method capable of detecting a temperature rise of a heat generating component without providing a special temperature detecting element.SOLUTION: An electronic circuit 1 has a power semiconductor Q1, which is a heat generating component, mounted on a substrate 10, includes: a tin wiring portion SP1 made of tin or a wiring material including tin provided in a part of a wiring pattern 20 which is a current path of a current flowing through the power semiconductor Q1; a voltage detecting section 4 for detecting a resistance value of the tin wiring portion SP1 as a voltage drop value by the tin wiring portion SP1; and an overheat judging section 5 for judging abnormal overheat of the power semiconductor Q1 on the basis of the voltage drop value detected by the voltage detecting section 4.SELECTED DRAWING: Figure 1

Inventors:
ASHIKAGA TORU
Application Number:
JP2017022760A
Publication Date:
August 16, 2018
Filing Date:
February 10, 2017
Export Citation:
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Assignee:
SANKEN ELECTRIC CO LTD
International Classes:
H02H5/04; G01K7/22; H02H7/00
Domestic Patent References:
JP2009165285A2009-07-23
JPH04308416A1992-10-30
JP2003188697A2003-07-04
JPS61128131A1986-06-16
JP2015077030A2015-04-20
JP2013257248A2013-12-26
Attorney, Agent or Firm:
堀 城之
前島 幸彦