Title:
電子機器、内蔵電源の劣化推定システムおよび内蔵電源の劣化推定方法
Document Type and Number:
Japanese Patent JP6485001
Kind Code:
B2
Abstract:
An electronic apparatus includes: an internal power supply to be charged; a charging circuit configured to supply electrical power from an external power supply to the internal power supply; a voltage measurement circuit configured to measure a voltage of the internal power supply; a temperature sensor configured to measure a temperature of the internal power supply; and an estimation circuit configured to estimate a degree of degradation of the internal power supply, wherein the estimation circuit determines whether it is possible to perform a degradation estimation process to estimate the degree of degradation of the internal power supply based on the voltage of the internal power supply and the temperature of the internal power supply, and performs the degradation estimation process on the internal power supply only when determining that it is possible to perform the degradation estimation process on the internal power supply.
Inventors:
Yuki Ikeda
Aihiko Eguchi
Aihiko Eguchi
Application Number:
JP2014225890A
Publication Date:
March 20, 2019
Filing Date:
November 06, 2014
Export Citation:
Assignee:
Konica Minolta Co., Ltd.
International Classes:
G01R31/00; G01R31/36; G03B42/02; H01M10/48; H02J7/00
Domestic Patent References:
| JP2000295778A | ||||
| JP2000299137A | ||||
| JP2012235551A | ||||
| JP2000224701A |
Foreign References:
| US20070252600 |
Attorney, Agent or Firm:
Gwangyang International Patent Office