Title:
WAVEFORM ANALYTICAL SYSTEM
Document Type and Number:
Japanese Patent JP3170600
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To obtain a waveform analytical system which can analyze a waveform even in a state that an ideal modulation factor and its reference signal do not exist regarding a waveform analysis which includes the reception of digital modulated waves and spectrum diffusion modulated waves.
SOLUTION: The input signal of digital modulated waves and spectrum diffusion modulated waves is lowered to an intermediate frequency by a receiver 1, and the signal is distributed into two signals by a distribution amplifier 8 so as to be amplified in such a way that a balanced modulator 9 performs a nonlinear operation. When the two signals are multiplied by the balanced modulator 9, a signal at the integral multiple of the input signal is generated. A signal which is generated as the integral multiple of an output signal is frequency-analyzed by a frequency analyzer 10, and a line spectrum according to a modulation factor is obtained. In addition, when the line spectrum is extracted by using a band-pass filter 11, modulated waves and a carrier frequency are obtained, and a waveform can be analyzed on the basis of them.
More Like This:
Inventors:
Hiroshi Ohkubo
Masashi Kobayashi
Masashi Kobayashi
Application Number:
JP9154697A
Publication Date:
May 28, 2001
Filing Date:
March 26, 1997
Export Citation:
Assignee:
Director General, Technical Research Division, Defense Agency
International Classes:
G01R23/16; H04B1/69; H04B1/707; H04B1/713; H04B7/00; H04L27/10; H04L27/18; H04L27/34; (IPC1-7): H04L27/34; G01R23/16; H04B1/707; H04L27/10
Domestic Patent References:
JP3214829A | ||||
JP6261082A | ||||
JP2268283A | ||||
JP5218914A | ||||
JP7177106A | ||||
JP8163187A | ||||
JP9200079A | ||||
JP9318682A |
Other References:
【文献】“2乗処理を用いた直接拡散波の諸元検出の検討”,1994年電子情報通信学会秋季大会講演論文集,基礎・境界,p.150,A-150
Attorney, Agent or Firm:
Takashi Murai
Previous Patent: 一般家庭用の薬保管ケース
Next Patent: QUANTUM WELL SEMICONDUCTOR LASER SYSTEM AND ITS MANUFACTURE
Next Patent: QUANTUM WELL SEMICONDUCTOR LASER SYSTEM AND ITS MANUFACTURE