Title:
ELEMENT ANALYSIS METHOD, ELEMENT ANALYZER, AND SAMPLE FOR ANALYZING ELEMENT
Document Type and Number:
Japanese Patent JP2006220596
Kind Code:
A
Abstract:
To provide an element analysis method for analyzing a very small amount of element in a sample on-site with high sensitivity, and also to provide a compact portable analyzer based on the method.
Laser beams are applied to a sample whose elements are analyzed, and a luminous column is formed on the irradiation surface of laser beams in the sample. Then, the emission spectrum of the luminous column is obtained, and the elements for composing the sample are analyzed by a luminous peak caused by the elements for composing the sample in the emission spectrum.
Inventors:
ITO AKIFUMI
OTA TAKAYUKI
OTA TAKAYUKI
Application Number:
JP2005035857A
Publication Date:
August 24, 2006
Filing Date:
February 14, 2005
Export Citation:
Assignee:
UNIV WAKAYAMA
International Classes:
G01N21/63
Attorney, Agent or Firm:
Kosaku Sugimura
Hiroshi Tokunaga
Shiro Fujitani
Kiyoshi Kuruma
Kazuyuki Tomita
Hiroshi Tokunaga
Shiro Fujitani
Kiyoshi Kuruma
Kazuyuki Tomita