To provide an element carrier device of semiconductor element test handler, capable of adjusting the spacing between picker heads that suctions a semiconductor elements to the desired spacing.
The element carrier device of semiconductor element test handler is comprised of a base section 10; a plurality of picker heads 20, which are placed so as to move horizontally over the base section 10 for fixing and releasing the semiconductor element; a cam plate 30, which is placed movably over the base section 10 and wherein a plurality of cam grooves 32 are formed obliquely and a connecting section, whose one side is fixed to each picker head 20 and the other side is connected movably with each cam groove 32, connecting the picker heads 20 and each cam groove 32; and driving units 51 to 58 and 61 making the cam plate 30 move reciprocatively, such that each connecting section is alternately located at arbitrary first position and a second position of each cam groove 32 of the cam plate 30 and the picker heads 20 become variable with respect arbitrary first pitch and second pitch.
| JPS62118269 | EVALUATING DEVICE FOR THERMAL FATIGUE LIFE |
| WO/2017/056390 | TEST SYSTEM |
LIM WOO YOUNG
PARK YOUNG GEUN
SONG HO KEUN
| JP2001215257A | 2001-08-10 | |||
| JP2001133520A | 2001-05-18 | |||
| JP2002164413A | 2002-06-07 | |||
| JP2003194878A | 2003-07-09 | |||
| JP2004039706A | 2004-02-05 | |||
| JPH09156758A | 1997-06-17 | |||
| JP2003066094A | 2003-03-05 |
Hidetoshi Tachibana
Yasukazu Sato
Hiroshi Yoshimoto
Yasushi Kawasaki
Takahashi
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