Title:
EMISSIVITY MEASURING APPARATUS
Document Type and Number:
Japanese Patent JP2009300134
Kind Code:
A
Abstract:
To provide an emissivity measuring apparatus which measures the emissivity of a sample accurately by a simple apparatus structure.
The apparatus includes a handle 18 which includes an electric furnace 13 fixed on its one end for heating the sample 4 and of which the other end pivots about a fulcrum 20. When the handle 18 has pivoted from a heating position A in which the electric furnace 13 is fitted into the sample 4 to a standby position B, the center line X of the electric furnace 13 is spaced with an inclination angle with respect to the sample 4.
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Inventors:
ISHIKAWA ATSUSHI
Application Number:
JP2008152461A
Publication Date:
December 24, 2009
Filing Date:
June 11, 2008
Export Citation:
Assignee:
IHI CORP
International Classes:
G01J5/00; G01J5/06; G01N25/00
Domestic Patent References:
JPH063194A | 1994-01-11 | |||
JPH0763717A | 1995-03-10 | |||
JP2004257769A | 2004-09-16 | |||
JP2001318003A | 2001-11-16 | |||
JPH08290929A | 1996-11-05 |
Attorney, Agent or Firm:
Yamada Patent Office
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