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Title:
ENVIRONMENT TESTING DEVICE WITH ANTICLOUD GLASS
Document Type and Number:
Japanese Patent JP3653139
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To enable observation of a whole internal state with a simple device almost free from the generation of a thermal load.
SOLUTION: An anticloud glass device 9 with an anticloud glass 92 is hooked on a glass inner door 8 in such a manner that the device 9 is moved in the X direction, and a heat space 11 between the inner door 8 and the device 9 is sealed with a gasket 93. The anticloud glass 9 is movable with an outer frame in the Y direction. The glass is stuck with an electroconductive film and this film is energized when observing the interior of a testing chamber 3. Therefore, it is possible to observe any selected part in the testing chamber through a small window by moving the anticloud glass device 9 in the X, Y directions. The carry-in quantity of heat when the electroconductive film is energized is small. The inner door 8 need not be removed during high temperature testing and the ease of operating the device is high.


Inventors:
Adachi, Kinji
Application Number:
JP1996000093445
Publication Date:
March 04, 2005
Filing Date:
March 22, 1996
Export Citation:
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Assignee:
TABAI ESPEC CORP
International Classes:
G01N17/00; B01F1/00; B01L1/00; B01L7/00; (IPC1-7): B01L7/00; G01N17/00
Domestic Patent References:
JP5287963A
JP54178929U
JP5655808U
Attorney, Agent or Firm:
景山 憲二



 
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