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Patent Searching and Data


Title:
EQUIPMENT FOR MEASURING SPECTRAL CHARACTERISTICS
Document Type and Number:
Japanese Patent JP2005189217
Kind Code:
A
Abstract:

To provide spectral characteristics measuring equipment that enables prevention of lowering of measurement accuracy caused by temperature changes.

The spectral characteristics measurement equipment comprises a light source 14 for making a measurement light irradiated on a lens to be inspected, a lens-arranging portion 3 for retaining the lens at a measurement position, a spectral element 19 for light dispersing the measurement light that has passed the lens retained at the measurement position, and a light-receiving element 21 for detecting the light amount value for respective wavelength components by light receiving the light dispersed measurement light; wherein the spectral characteristics of the lens are determined, based on spectra obtained from the detected light amount value. The measurement equipment is provided with a memory 200 where emission spectra of the light source 14 are prestored, and a controller 100 correcting the spectral characteristics of the lens, based on the shift amount obtained by detecting the shifting amount, to the stored emission spectra of the measured light source 14 by retreating the lens from the measurement position.


Inventors:
YANAGI HIDEKAZU
Application Number:
JP2003434804A
Publication Date:
July 14, 2005
Filing Date:
December 26, 2003
Export Citation:
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Assignee:
TOPCON CORP
International Classes:
G01J3/28; G01M11/00; G01M11/02; (IPC1-7): G01M11/02; G01J3/28; G01M11/00
Attorney, Agent or Firm:
Masayoshi Misawa