Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
EQUIPMENT AND METHOD FOR INSPECTING CAPACITOR
Document Type and Number:
Japanese Patent JP3932793
Kind Code:
B2
Abstract:

PROBLEM TO BE SOLVED: To solve a problem that a low ESR capacitor of 100 mΩ or less can not be inspected sufficiently because of high total impedance of an inspection circuit, and a problem that a stabilized inspection can not be ensured due to variation in the characteristics of a sample because of the lack of a circuit for controlling the applied current and to provide controlled equipment and method for inspecting and sorting low ESR capacitors at a high rate.
SOLUTION: An inspection circuit part comprising a charging circuit and a discharging circuit is arranged on the same plane, a plurality of power supply capacitors 2 are arranged in the direction intersecting the plane of the inspection circuit part and connected in parallel and then they are arranged integrally so that a low ESR capacitor can be provided with a sufficiently large current and a current stress having a sufficiently quick response under conditions optimal for the rating of the capacitor.


Inventors:
Kawato Kazuo
Yoji Masuda
Kuratani Etsuji
Moriguchi Yukio
Yoshi Tsuyoshi No
Application Number:
JP2000296268A
Publication Date:
June 20, 2007
Filing Date:
September 28, 2000
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Matsushita Electric Industrial Co., Ltd
International Classes:
G01R27/26; G01R31/00; H01G13/00; (IPC1-7): H01G13/00; G01R27/26; G01R31/00
Domestic Patent References:
JP9152455A
JP2000150329A
JP8017672A
JP2000058370A
JP62123367A
JP2001338851A
JP8222411A
Attorney, Agent or Firm:
Fumio Iwahashi
Hiroki Naito
Daisuke Nagano