Title:
凍結乾燥処理中に脱水運転を監視するための装置及び方法
Document Type and Number:
Japanese Patent JP2008525750
Kind Code:
A
Abstract:
The device has an analyzer to analyze a gas contained in a freeze-drying enclosure (10). The analyzer has a gas ionization system (1) with a plasma source, in contact with the gas, combined with a generator generating the plasma. An ionized gas analyzing system has a sensor (20) arranged near the plasma source connected to an optical emission spectrometer (22) for analyzing an evolution of a radiation spectrum emitted by the plasma. An independent claim is also included for a method of controlling a dehydration operation during a freeze-drying process.
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Inventors:
Nomine, Cyril
Application Number:
JP2007547594A
Publication Date:
July 17, 2008
Filing Date:
December 19, 2005
Export Citation:
Assignee:
Alcatel-Lucent
International Classes:
F26B5/10; F26B25/00; G01N21/68; H05H1/00; H05H1/46
Domestic Patent References:
| JPH0914834A | 1997-01-17 | |||
| JPH04290428A | 1992-10-15 | |||
| JPH11354297A | 1999-12-24 | |||
| JPS62184334A | 1987-08-12 | |||
| JP2000214092A | 2000-08-04 | |||
| JP2002228356A | 2002-08-14 | |||
| JP2004288462A | 2004-10-14 | |||
| JP2003194460A | 2003-07-09 |
Attorney, Agent or Firm:
Yoshio Kawaguchi
Makoto Ono
Chihiro Watanabe
Kenkyo Kanayama
Katsuma Osaki
Mitsuaki Tsubokura
Makoto Ono
Chihiro Watanabe
Kenkyo Kanayama
Katsuma Osaki
Mitsuaki Tsubokura