To simply and effectively evaluate metal resistant ion migration suitability of a paper base material thermosetting resin laminated board by treating the board with osmium tetraoxide, and measuring distribution of osmium in the board by using an electron probe microanalyser.
A paper base material phenol resin laminated board is cut, its cut surface is polished, and fixed onto a slide glass in a sealed desiccator. A container filled with osmium tetraoxide is placed in a bottom of the desiccator. It is reacted in vapor phase for a long time, osmium is added to a double bond of olefin carbon side chain originated from phenol resin in the board, and labeled. This board is provided for an electron probe microanalyser. An element analysis and a shape observation are simultaneously conducted. A concentration distribution of the phenol resin is traced as that of the osmium. That is, a sample surface is sequentially analyzed in a pixel size and data at respectively analyzing points are acquired and analyzed.
HAMADA CHUHEI
MIYAHARA TOSHIHIRO
