Title:
FOR-EVALUATION MANUFACTURING PATTERN FOR THREE-DIMENSIONAL MANUFACTURING APPARATUS
Document Type and Number:
Japanese Patent JP2023026163
Kind Code:
A
Abstract:
To provide a for-evaluation manufacturing pattern allowing for correctly evaluating the performance of a three-dimensional manufacturing apparatus.SOLUTION: A for-evaluation manufacturing pattern 100 for a three-dimensional manufacturing apparatus comprises a base 101, structures 111, 112, 113 and 114 formed on the base 101, and an auxiliary mark 121 formed in the structures 111, 112, 113 and 114 or a reference plane 102 of the base 101 and indicative of reference points Q2 and Q3 of the structures 111, 112, 113 and 114.SELECTED DRAWING: Figure 3
Inventors:
MASUDA KAZUHIRO
KOIWA KOZO
MIYAKITA AYUMI
KOIWA KOZO
MIYAKITA AYUMI
Application Number:
JP2021131894A
Publication Date:
February 24, 2023
Filing Date:
August 13, 2021
Export Citation:
Assignee:
JEOL LTD
International Classes:
B22F10/31; B22F10/28; B29C64/30; B29C64/386; B33Y50/00; B33Y80/00
Attorney, Agent or Firm:
Patent Attorney Corporation Shinyu International Patent Office
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