Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
光周波数コム装置を用いたレーザ周波数測定装置の評価方法
Document Type and Number:
Japanese Patent JP6522414
Kind Code:
B2
More Like This:
WO/1991/005239LIGHT RECEIVING SYSTEM OF HETERODYNE DETECTION AND IMAGE FORMING DEVICE FOR LIGHT TRANSMISSION IMAGE USING SAID LIGHT RECEIVING SYSTEM
WO/1994/016294NANOMETER METROLOGY
Inventors:
川▲崎▼ 和彦
Application Number:
JP2015095981A
Publication Date:
May 29, 2019
Filing Date:
May 08, 2015
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Mitutoyo Corporation
International Classes:
G01J9/04
Domestic Patent References:
JP2013072848A
JP2014190759A
JP2007263977A
JP2257026A
Foreign References:
US20130302027
Other References:
松本 弘一 Hirokazu Matsumoto ほか,光周波数コム光源の干渉測長法による評価 Evaluation of Optical Frequency Comb by Interferometric Length Metrology,2010年春季第57回応用物理学関係連合講演会講演予稿集,2010年,03-073,[CD-ROM}
Attorney, Agent or Firm:
Satoshi Takaya
Keisuke Matsuyama
Tsuyoshi Makino
Takashi Fujita
Shuzo Sudo



 
Previous Patent: 排水性編物、及び排水機能付き衣料製品

Next Patent: 分離型のＬＥＤ照明器具の接続構造