Title:
EVALUATION METHOD OF SCRATCH RESISTANCE OF MAGNETIC RECORDING MEDIUM, AND MANUFACTURING METHOD OF MAGNETIC RECORDING MEDIUM
Document Type and Number:
Japanese Patent JP2017045497
Kind Code:
A
Abstract:
PROBLEM TO BE SOLVED: To evaluate scratch resistance of a magnetic recording medium easily.SOLUTION: An evaluation method of scratch resistance includes a step of detecting and evaluating a scratch mark of a magnetic recording medium including a magnetic recording layer containing magnetic particles and a metal oxide grain boundary provided between the magnetic particles, based on information related to a reflection intensity of light in a predetermined wavelength region. The predetermined wavelength region at least includes a second wavelength region of 600 nm to 700 nm, and further a first wavelength region of 300 nm to 500 nm.SELECTED DRAWING: Figure 1
Inventors:
WATABE AKIRA
ONIZUKA TSUYOSHI
HYODO HIROYUKI
ONIZUKA TSUYOSHI
HYODO HIROYUKI
Application Number:
JP2015169074A
Publication Date:
March 02, 2017
Filing Date:
August 28, 2015
Export Citation:
Assignee:
TOSHIBA CORP
International Classes:
G11B5/84; G01N21/88; G11B5/65
Attorney, Agent or Firm:
Suzue International Patent Office
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