Title:
EVENT TYPE TEST SYSTEM BASED ON DELTA TIME
Document Type and Number:
Japanese Patent JP3212583
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide an event type test system supplying a test signal to a tested device (DUT) for inspecting an output signal of the DUT at the timing of a strobe signal.
SOLUTION: This event type test system is constructed of an event memory 20 storing timing data representing a time difference between the adjacent two events and consisting of an integral multiple data of a reference clock period and a fraction data of the reference clock period, an address sequencer 18 generating address data so as to access the event memory 20 for reading out the timing data, a timing counter logic part adding the timing data for deciding total timing from a predetermined time reference point as to the corresponding event, an event generation circuit generating respective events on the basis of the total timing, and a host computer controlling the whole operation of the event type test system via a test program.
Inventors:
James Alan Turnquist
Application Number:
JP2000045102A
Publication Date:
September 25, 2001
Filing Date:
February 17, 2000
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/28; G01R31/3183; G01R31/319; G01R31/3193; (IPC1-7): G01R31/3183
Domestic Patent References:
| JP8146103A | ||||
| JP587886A | ||||
| JP4240582A | ||||
| JP729486U | ||||
| JP6223495B2 |