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Title:
EXPOSURE SYSTEM BY REDUCED PROJECTION
Document Type and Number:
Japanese Patent JPS5814137
Kind Code:
A
Abstract:

PURPOSE: To eliminate exchanging of reticles and to improve exposure processing efficiency by shutting or exposing one normal pattern and one monitoring pattern alternately and adequately thereby forming the monitoring pattern properly on a substrate to be exposed.

CONSTITUTION: Pattern shutters 12, 13 are provided on both sudes of a reticle 11 formed of one monitoring pattern M in the circumferential parts of nine normal patterns P1WP9. The shutters 12, 13 are slid laterally to shut or expose, for example, the patterns P1 and M alternately, whereby the monitoring pattern is properly transferred on a substrate 2 to be exposed.


Inventors:
KANAZAWA MASAO
Application Number:
JP11176781A
Publication Date:
January 26, 1983
Filing Date:
July 16, 1981
Export Citation:
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Assignee:
FUJITSU LTD
International Classes:
G03B27/42; G03F1/44; G03F1/70; G03F7/20; G03F7/22; H01L21/027; H01L21/30; (IPC1-7): G03B27/52; G03F7/20
Domestic Patent References:
JPS5226902A1977-02-28
JPS55129333A1980-10-07
JPS5679431A1981-06-30
JPS5748233A1982-03-19
Attorney, Agent or Firm:
Sadaichi Igita



 
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