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Title:
FACILITY DIAGNOSTIC SUPPORT SYSTEM
Document Type and Number:
Japanese Patent JP2004021712
Kind Code:
A
Abstract:

To contribute to the support, improvement in efficiency of operation management, and improvement in quality of a facility maintenance service performed every day by use of collected data.

This facility diagnostic support system for collecting and monitoring the data related to a plant facility through a network has a tendency prediction means for applying the data to an approximation processing to draw an approximation curve, and further extending or tracing back the approximation curve to draw a tendency prediction curve for a part having no data.


Inventors:
FUKUZAWA MITSUTAKA
SUZUKI YASUNORI
ABE HIROTO
WATANABE HISASHI
Application Number:
JP2002177309A
Publication Date:
January 22, 2004
Filing Date:
June 18, 2002
Export Citation:
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Assignee:
YOKOGAWA ELECTRIC CORP
International Classes:
G05B9/02; G05B23/02; G06F17/17; G06F17/18; G06F19/00; G06Q10/04; G06Q50/00; G06Q50/06; (IPC1-7): G05B23/02; G05B9/02; G06F17/17; G06F17/18; G06F17/60; G06F19/00
Domestic Patent References:
JP2002023841A2002-01-25
JP2001005520A2001-01-12
JP2002049417A2002-02-15
JP2000122713A2000-04-28
JP2001337824A2001-12-07
JP2002152855A2002-05-24
JP2001067117A2001-03-16
JPH0926817A1997-01-28
JP2000259234A2000-09-22
JPH11110038A1999-04-23
JPS63167086A1988-07-11
JPH05288580A1993-11-02
JP2001255932A2001-09-21
JP2001356814A2001-12-26
JP2002024423A2002-01-25
JP2002087703A2002-03-27
JP2000242328A2000-09-08



 
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