FACILITY OPERATION RATE MONITOR - HITACHI HOKKAI SEMICONDUCTOR

Title:

FACILITY OPERATION RATE MONITOR

Document Type and Number:

Japanese Patent JP2001100820

Kind Code:

A

Abstract:

To dispense with an interface by detecting various signals without making electrical connections with production facilities.

A facility operation rate monitor 61 is composed of a detecting sensor part and a main body 13 of operation rate monitor. The detecting sensor part is composed of a sensor part 12a, an amplifier part 12b and a waveform shaping part 12c. The sensor part 12a is composed of various sensors, such as photosensor like photodiode and sound sensor like microphone and attached to the lamp or buzzer of a signal tower ST provided in each of production facilities 71, detects various signals and outputs them to the main body 13 of operation rate monitor as operation data. Thus, the facility operation rate monitor 61 can be easily attached to the production facility 71 in a short time.

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Inventors:

OIDE TAKU
HIRAI MUTSUO
YAGISAWA TORU
NASUKAWA SATORU

Application Number:

JP27553199A

Publication Date:

April 13, 2001

Filing Date:

September 29, 1999

Export Citation:

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Assignee:

HITACHI HOKKAI SEMICONDUCTOR

International Classes:

G05B19/18; B23Q41/08; G05B19/4063; G05B19/418; G06F17/40; G06Q50/00; G06Q50/04; (IPC1-7): G05B19/18; B23Q41/08; G05B19/4063; G06F17/60

Attorney, Agent or Firm:

Yamato Tsutsui

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