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Title:
FAR INFRARED IMAGING SYSTEM AND FAR INFRARED IMAGING METHOD
Document Type and Number:
Japanese Patent JP2007325120
Kind Code:
A
Abstract:

To provide a far infrared imaging system and a far infrared imaging method, which correct output values from a plurality of far infrared imaging apparatuses so that these output values are approximately the same for the same object.

The far infrared imaging system corrects an output value of each image sensor and acquires imaging data by using a plurality of far infrared imaging apparatuses having image sensors arrayed like a matrix and connected to each other so that output values can be communicated with each other, measures the surface temperature of an object and stores the ratio of an output value change to a temperature change in each image sensor. The far infrared imaging apparatus acquires the measured surface temperature, reads an output value corresponding to the acquired surface temperature in each image sensor, corrects the output value by using the ratio of the output value change to the temperature change which is stored in each image sensor, and outputs the corrected output value to the external.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
HAGIWARA TSUYOSHI
Application Number:
JP2006155194A
Publication Date:
December 13, 2007
Filing Date:
June 02, 2006
Export Citation:
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Assignee:
SUMITOMO ELECTRIC INDUSTRIES
International Classes:
H04N5/33; B60R1/00; H04N5/225; H04N5/335; H04N5/378; H04N7/18
Domestic Patent References:
JPH04225191A1992-08-14
JP2001264178A2001-09-26
JPH11211469A1999-08-06
JP2005096752A2005-04-14
JP2005271693A2005-10-06
Foreign References:
WO2004106858A12004-12-09
Attorney, Agent or Firm:
Nobuo Kono