Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
FAULT ANALYSIS PROCESSING SYSTEM
Document Type and Number:
Japanese Patent JPH04107642
Kind Code:
A
Abstract:

PURPOSE: To effectively mechanize and automate such tasks as the development, the test, and the maintenance of software by searching the patterns with use of a mask pattern.

CONSTITUTION: A mask pattern used for designation of C (character) and X (hexadecimal) is decided together with the start and end addresses in a mask pattern command analyzing process 21 where the contents pointed by the operands of mask pattern commands 11 and 12 given from a user are interpreted. A fault memory information read processing means 22 evolves the contents covering a start address through an end address to a memory from a fault memory information store medium 30. Thus the fault memory evolving information 25 is obtained. Then a mask pattern search processing means 23 compares the mask pattern designated by the user with the contents evolved to the memory and retrieves a coincident area. Thus the development, the test, and the maintenance of software are effectively mechanized and automated.


Inventors:
SHIRAISHI HISASHI
Application Number:
JP22615790A
Publication Date:
April 09, 1992
Filing Date:
August 28, 1990
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
NEC CORP
International Classes:
G06F11/22; (IPC1-7): G06F11/22
Attorney, Agent or Firm:
Uchihara Shin



 
Previous Patent: 回転部材の固着構造

Next Patent: 接合体の製造方法