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Patent Searching and Data


Title:
FAULT DIAGNOSIS METHOD AND FAULT DIAGNOSIS SYSTEM
Document Type and Number:
Japanese Patent JP2004094771
Kind Code:
A
Abstract:

To provide a fault diagnosis method/a fault diagnosis system by which easy recovery work is made in a short period of time in accordance with priority order even if a device has faults at a plurality of sites.

A fault site division means 2 divides the division-allowing sites as modules. A fault estimation rate establishment means 3 establishes a fault estimation rate showing the index of fault forecast for every test item of the device and to the respective divided modules. An adjustment item establishment means 4 establishes an adjustable adjustment item for every test item of the device and for the respective modules. A calculating means 5 divides the sum of the fault estimation rates of defect generating test items by the total value of the fault estimation rates of the entire test items to calculate an estimation fault index for the respective modules. An adjustment preferential item decision means 6 selects the module having the maximum calculated estimation fault index to decide the adjustment item having the maximum sum of the fault estimation rate as an adjustment preferential item for preferential adjustment.


Inventors:
KATO SAYURI
Application Number:
JP2002257464A
Publication Date:
March 25, 2004
Filing Date:
September 03, 2002
Export Citation:
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Assignee:
HITACHI INT ELECTRIC INC
International Classes:
G06F11/22; G01R31/00; (IPC1-7): G06F11/22; G01R31/00
Attorney, Agent or Firm:
Hisako Ishido
Mitsue Haba
Hideo Akazawa
Eiichi Yamaguchi