To solve such a problem that, when identifying a defective piece using a marking target by a conventional technology, the technology is suitable for performing a one-time punch-out process, however, when tracing a defective process, the technology is not suitable for grasping which process has made a failure occur, and thus a failure analysis becomes difficult.
A first mark is added along a first part of a marking target for a first piece determined as a failure in a first inspection process. A second mark is added along a second part of the marking target for a second piece determined as a failure in a second inspection process arranged downstream of the first inspection process. The second mark with a larger size incorporates the first mark. Thereby, the location on which the marks are added is collected to one place, thus facilitating to confirm the mark with ease. In addition, a process determined as a failure can be identified by the size and shape of the failure mark. Accordingly, the failure process can be traced efficiently.
Osamu Suzawa
Kazuhiko Miyasaka
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