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Title:
FINE OBJECT SAMPLING TOOL AND FINE OBJECT SAMPLING METHOD
Document Type and Number:
Japanese Patent JP2011117915
Kind Code:
A
Abstract:

To provide a fine object sampling tool and a fine object sampling method capable of sampling a fine object of a sufficient sampling amount regardless of the shape of a fine object sampling spot, and sampling the fine object simply and easily by preventing contamination of a foreign matter.

This fine object sampling tool 100 for sampling a fine object existing in a criminal field or the like or a sample for DNA type identification includes: a body part 10 comprising an adhesive part 30 comprising a gel sheet of a binder resin, and an operation part 20 having the adhesive part 30 attached at least to one end; a first protection sheet 40 to be stuck onto the adhesive part 30, a protection cap 60 covering the adhesive part 30; and a second protection sheet 70 to be stuck onto the protection cap 60.


Inventors:
Ono, Yukie
Miyaki, Kayo
Adachi, Mihoko
Application Number:
JP2009000278058
Publication Date:
June 16, 2011
Filing Date:
December 07, 2009
Export Citation:
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Assignee:
EKUSHIIRU CORPORATION:KK
International Classes:
G01N1/04
Domestic Patent References:
JP2007181525A
JP2004198397A
JPH01137452U
JP2007181526A
JP2007181525A
JP2004198397A
JPH01137452U
Attorney, Agent or Firm:
西尾 章