Title:
FINE PARTICLE DEPOSIT AMOUNT MEASUREMENT METHOD OF HONEYCOMB STRUCTURE
Document Type and Number:
Japanese Patent JP2008231930
Kind Code:
A
Abstract:
To provide a method usable for on-board diagnosis of fine particles.
In a honeycomb structure which includes a plurality of circulation holes partitioned by a partition wall and penetrating in an axis direction and keeps three or more electrodes on a side surface so as to be equally distant from one end surface and to separate from one another, arbitrary two electrodes are selected from the electrodes to measure an electrical characteristic between the two electrodes. On the basis of the measured electrical characteristic, the fine particle deposition amount measurement method of the honeycomb structure determines a fine particle deposition amount in a zone between the arbitrary two electrodes in the honeycomb structure.
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Inventors:
KATSUYAMA KYOSUKE
KITO MASANOBU
MIYAIRI YUKIO
SAKUMA TAKESHI
KITO MASANOBU
MIYAIRI YUKIO
SAKUMA TAKESHI
Application Number:
JP2007068333A
Publication Date:
October 02, 2008
Filing Date:
March 16, 2007
Export Citation:
Assignee:
NGK INSULATORS LTD
International Classes:
F01N3/02; B01D46/00; B01D46/42; G01N27/02; G01N27/04; G01N27/22
Attorney, Agent or Firm:
Ippei Watanabe
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