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Patent Searching and Data


Title:
FLAW INSPECTING DEVICE
Document Type and Number:
Japanese Patent JPH03261852
Kind Code:
A
Abstract:

PURPOSE: To detect a flaw at high speed by shielding the regularly reflected light in an entire scanning line region and allowing only scattered light to pass by providing a slit disc in place of a light shielding body when the flaw of a planar plate such as an fine object having a mirror surface, for example, a solar cell is inspected and rotationally driving the disc in synchronous relation to a scanning line.

CONSTITUTION: The laser beam 20 from a laser oscillator 1 is passed through a collimator lens 2 to be brought to parallel beam which is, in turn, condensed to a surface to be inspected by a lens 3. At this time, the beam is defected by a galvanomirror 4 to scan the surface to be inspected and the reflected and scattering beams generated from the surface to be inspected are allowed to be incident to a slit disc 5. At this time, the distance between the lens 3 and the surface to be inspected is set to l1 and the disc 5 is set to l2 to set the relation between both distances to l1=2l2. By this constitution, the beam diameter on the disc 5 becomes extremely fine and scattered beam passes through the slit disc 5 to be incident on a photoelectric sensor 7 through a glass fiber bundle 6.


Inventors:
FUKUSHIMA MIKI
Application Number:
JP6136590A
Publication Date:
November 21, 1991
Filing Date:
March 12, 1990
Export Citation:
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Assignee:
NEC CORP
International Classes:
G01N21/88; (IPC1-7): G01N21/88
Attorney, Agent or Firm:
Uchihara Shin