Title:
Time-of-flight mass spectrometer
Document Type and Number:
Japanese Patent JP6287419
Kind Code:
B2
Abstract:
PROBLEM TO BE SOLVED: To provide a time-of-flight type mass spectroscope that enhances the attainment efficiency of ions to a detector with a simple construction while maintaining high mass resolution.SOLUTION: The potential gradient of electric field formed in a second stage is not changed, but the inclination of the potential gradient of electric field formed in a first stage is greatly increased for a dual stage type reflectron in which electric field is adjusted to have excellent time convergence of ions. An auxiliary free space in which potential is fixed is provided in a terminal region of the first stage which is adjacent to the second stage, and a potential variation start point in the first stage is shifted to be nearer to the entrance end of the reflectron by only the amount corresponding to the auxiliary free space. Therefore, a free flight space under no electric field is extended to a start end region of the first stage, and the flight time caused by the substantial extension of the free flight space is properly adjusted, and a fold-back condition of the electric field of the second stage is matched to suppress reduction of time convergence. Accordingly, the attainment efficiency of ions can be improved with maintaining high mass resolution by merely adjusting a voltage applied to plural flat plate electrodes constituting the reflectron.
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Inventors:
Kei Kodera
Application Number:
JP2014059672A
Publication Date:
March 07, 2018
Filing Date:
March 24, 2014
Export Citation:
Assignee:
SHIMADZU CORPORATION
International Classes:
H01J49/40; G01N27/62
Domestic Patent References:
| JP10199475A |
Foreign References:
| WO2012033094A1 | ||||
| US6365892 |
Attorney, Agent or Firm:
Kyoto International Patent Office