Title:
FLUORESCENT X-RAY ANALYZER
Document Type and Number:
Japanese Patent JP2023156889
Kind Code:
A
Abstract:
To provide a sample fluorescent X-ray analyzer which can analyze a sample with high accuracy.SOLUTION: A fluorescent X-ray analyzer includes: a sample holding part 1 in which a sample P is held; an X-ray irradiation part 2 which irradiates the sample P with primary X-rays (X1); a detection part 3 which detects fluorescent X-rays (X2) generated from the sample P; and an analysis part 5 which analyzes the sample P based on fluorescent X-rays. The analysis part 5 performs the correction by normalizing a numerical value K1 proportional to the amount of a predetermined element contained in the sample P measured by the element measuring part 51 with a numerical value K2 proportional to the amount of the sample P measured by a sample measuring section 52.SELECTED DRAWING: Figure 1
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Inventors:
TSUJI KOICHI
Application Number:
JP2022066526A
Publication Date:
October 25, 2023
Filing Date:
April 13, 2022
Export Citation:
Assignee:
UNIV PUBLIC CORP OSAKA
International Classes:
G01N23/223
Attorney, Agent or Firm:
Masaki Kobayashi
Hideki Shinohara
Hideki Shinohara
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