Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
FLUORESCENCE MEASURING METHOD AND FLUORESCENCE MICROSCOPE
Document Type and Number:
Japanese Patent JP2007225381
Kind Code:
A
Abstract:

To solve the problem in a fluorescence microscope wherein, in a case of excitation light of a plurality of wavelengths, overlapping of arising two fluorescence peaks with each other prevents accurate fluorescence peaks by excitation light from being simultaneously obtained, and overlapping of fluorescence peaks in multicolor excitation light, in particular, makes it difficult to perform dynamic state measurement on cells, or detection, measurement, etc. on a relation between a chemical and cells.

By a first dichroic mirror 2, excitation light of two wavelengths intermittently selected in order from the wavelengths of excitation light is separated from fluorescence of two wavelengths arising from a specimen. The fluorescence of two wavelengths is separated into individual fluorescence peaks by being further reflected/transmitted by a second dichroic mirror 4. These are detected by electronic detectors 5 and 6. If necessary, the fluorescence peaks are displayed in order of excitation wavelength and the two fluorescence peaks are continuously observed.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
SUGIMOTO KENJI
Application Number:
JP2006045426A
Publication Date:
September 06, 2007
Filing Date:
February 22, 2006
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
UNIV OSAKA PREFECTURE
International Classes:
G01N21/64; G02B21/00; G02B21/06
Domestic Patent References:
JP2002287034A2002-10-03
JP2005195485A2005-07-21
JP2002267934A2002-09-18
Attorney, Agent or Firm:
河▲崎▼ 眞樹