FLUORESCENT X-RAY ANALYSIS METHOD AND DEVICE THEREFOR

Japanese Patent JP2699134

B2

PURPOSE: To achieve a rapid analysis without any pre-treatment, etc., of a sample by applying X rays which are turned into monochromatic by spectral crystal to the sample and then determining a small amount of precious metal element by detecting generated characteristic X rays with a semiconductor detector.
CONSTITUTION: For example, X rays where the wavelength region of MOKα rays is turned into monochromatic are applied to a sample 5 through a slit 1c by an X-ray irradiation means consisting of a molybdenum bulb 1a and lithium fluoride 1b. By detecting the characteristic X rays generated at this time using a semiconductor detector 4, Cu, Zn, As, Se, Au, Hg, Pb, and Bi are determined. Then, WLβ1 rays are turned into monochromatic by the X-ray irradiation means consisting of a tungsten bulb 2a and lithium fluoride crystal 2b and V, Cr, Co, and Ni are determined in the similar manner. Then, continuous X rays are turned into monochromatic by the X-ray irradiation means consisting of a tungsten bulb 3a and germanium crystal 3b and Mo, Pd, Ag, Cd, In, Sb, and Te are determined in the similar manner.

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Tatsushi Wakisaka
Wakasa Masanobu
Masatsugu Tanaka
Naoki Morita
Nishihagi Kazuo
Shinichi Terada

JP35060292A

January 19, 1998

December 03, 1992

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Kao Corporation
Technos Co., Ltd.

G01N23/223; (IPC1-7): G01N23/223

JP6280949A
JP6064236A
JP62261944A
JP62265555A
JP1156646A
JP6123717A
JP373834A
JP59214734A
JP59179361U
JP228819B2

Yoshinori Hosoda

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