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Title:
FLUORINE-CONTAINING COPOLYMER, PHOTORESIST, AND A METHOD FOR FORMING PHOTORESIST IMAGE ON SUBSTRATE
Document Type and Number:
Japanese Patent JP2009161770
Kind Code:
A
Abstract:

To provide another new resist composition for use at a wavelength of 193 nm or lower, in particular at a wavelength of 157 nm, which has not only high transparency at these short wavelengths but also other key properties including good plasma etching resistance and adhesion.

A fluorine-containing copolymer includes: (i) a repeat unit derived from at least one ethylenically unsaturated compound including at least one fluorine atom covalently bonded to an ethylenically unsaturated carbon atom; and (ii) a repeat unit derived from a group comprising CH2=CHO2CR15, CH2=CHOCH2R15 and CH2=CHOR15, wherein in formulas R15 is nearly 4C-20C saturated alkyl group and optionally containing one or a plurality of ether oxygens under the condition that a ratio of carbon atoms to a hydrogen atom is 0.58 or more.


Inventors:
FEIRING ANDREW EDWARD
FELDMAN JERALD
Application Number:
JP2009094338A
Publication Date:
July 23, 2009
Filing Date:
April 08, 2009
Export Citation:
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Assignee:
DU PONT
International Classes:
C08F214/18; C08F14/18; C08F114/18; C08F216/12; C08F216/14; C08F218/04; C08F224/00; C08F232/06; C08F232/08; C08F234/02; C08K5/00; C08L27/12; G03C1/73; G03F7/004; G03F7/038; G03F7/039; G03F7/20; G03F7/30; G03F7/32; H01L21/027
Domestic Patent References:
JPH1011569A1998-01-16
JP2643599B21997-08-20
Attorney, Agent or Firm:
Yoshikazu Tani
Kazuo Abe