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Title:
FLUORINE-CONTAINING MONOMER, FLUORINE-CONTAINING POLYMER COMPOUND, RESIST MATERIAL AND METHOD FOR FORMING PATTERN
Document Type and Number:
Japanese Patent JP2009029974
Kind Code:
A
Abstract:

To provide a monomer for a base resin of a resist material.

A fluorine-containing monomer expressed by formula (1) is disclosed. In formula (1), R1 represents H or a 1-20C monovalent hydrocarbon group, and when R1 is a monovalent hydrocarbon group, a constituent -CH2- may be substituted with -O- or -C(=O)-; R2 represents H, a fluorine atom, a methyl group or a trifluoromethyl group; each of R3 and R4 represents H or a 1-8C monovalent hydrocarbon group, or R3 and R4 may be mutually bonded to form an aliphatic hydrocarbon ring together with the carbon to which both of them are bonded; and A represents a 1-6C bivalent hydrocarbon group. The fluorine-containing monomer is useful as a monomer for manufacturing a base resin of a functional material and a radiation-sensitive resist material. A polymer compound obtained from the monomer is excellent in resolution and water proofing property and extremely effective for precise microprocessing as a base resin of a resist material.


Inventors:
HASEGAWA KOJI
KANOU TAKESHI
KOBAYASHI KATSUHIRO
NISHI TSUNEHIRO
WATANABE TAKESHI
Application Number:
JP2007196907A
Publication Date:
February 12, 2009
Filing Date:
July 30, 2007
Export Citation:
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Assignee:
SHINETSU CHEMICAL CO
International Classes:
C08F20/28; C07C69/003; C07C69/67; C07C69/753; C08F32/08; G03F7/039; G03F7/38; H01L21/027
Attorney, Agent or Firm:
Takashi Kojima
Saori Shigematsu
Katsunari Kobayashi
Takeshi Ishikawa