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Patent Searching and Data


Title:
FOREIGN-MATTER INSPECTING APPARATUS
Document Type and Number:
Japanese Patent JPH0431753
Kind Code:
A
Abstract:

PURPOSE: To suppress the effect of the scattered light caused by the surface roughness of a material under inspection to a minimum and to detect the scattered light from a foreign matter readily by specifying the emitting direction of detecting light on the surface of the material under inspection and the detecting direction of the scattered light.

CONSTITUTION: A light emitting means 3 is arranged so that the light is emitted in the direction in parallel with the rolling direction of a base material 1. A slant angle θ of detecting light from the light emitting means 3 with respect to the base material 1 is usually selected at 5 - 25 degrees so as to increase the scattered light from a foreign matter. A detecting means 8 for detecting the scattered light from a detecting position is provided so that the optical axis is inclined to the side where the means 3 is arranged with respect to the base material 1. The slant angle α is set at 60 degrees or less. The scattered light (noise) caused by the irregularities on a material under inspection itself is suppressed to a minimum by specifying the angle of the optical axis, and the scattered light caused by the foreign matter can be positively detected.


Inventors:
YAGI YUTAKA
KIKUMA FUMIO
Application Number:
JP13809590A
Publication Date:
February 03, 1992
Filing Date:
May 28, 1990
Export Citation:
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Assignee:
DAINIPPON PRINTING CO LTD
International Classes:
G01N21/88; G01N21/89; G01N21/892; G01N21/94; (IPC1-7): G01N21/88; G01N21/89
Attorney, Agent or Firm:
Kyozo Norimatsu