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Title:
FORMATION OF FET
Document Type and Number:
Japanese Patent JP2000106427
Kind Code:
A
Abstract:

To use deeper source/drain contact regions without affecting gate overlapping by forming on a substrate a first region covered by a first insulating layer and a conductive layer, and a second region covered by the first insulating layer.

A field-effect transistor is formed on a substrate consisting of at least a first portion and at least a second portion. The first portion defines a first region being covered with an amorphous silicon layer 2 and a gate dielectric stack. The second portion defines a second region being covered with at least a single insulating layer 1. The substrate is a wafer or a slice of a semiconductor, such as a Ge, GaAs, Ge or SiGe semiconductor, either partially processed or unprocessed. Particularly, if the substrate is a partially processed wafer or a slice, at least a part of an active and/or passive element may be formed thereon in advance.


Inventors:
BADENES GONCAL
DEFERM LUDO
BECKX STEPHAN
SERGE VAN HEEREMEERUSUFU
Application Number:
JP9218199A
Publication Date:
April 11, 2000
Filing Date:
March 31, 1999
Export Citation:
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Assignee:
IMEC INTER UNI MICRO ELECTR (BE)
International Classes:
H01L29/78; H01L21/336; (IPC1-7): H01L29/78
Attorney, Agent or Firm:
Aoyama Ryo (1 person outside)