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Title:
HARMONIC PROBING METHOD AND DEVICE
Document Type and Number:
Japanese Patent JP2002048827
Kind Code:
A
Abstract:

To provide a harmonic probing method and device capable of saving time and labor on a site of installation, harmonic probing, and data analysis and advantageous in preventing error connections in voltage and current connection.

In the harmonic probing method to measure the amount of occurrence of harmonics in the paths of distribution lines extended from substations, the mount of occurrence of harmonics is handled as harmonic electric energy.


Inventors:
NAGANO TAKASHI
MATSUDA SHIGEKI
SUNANO SHUJI
MATSUSHITA TADASHI
Application Number:
JP2000235192A
Publication Date:
February 15, 2002
Filing Date:
August 03, 2000
Export Citation:
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Assignee:
SHIKOKU ELEC POWER
TECHNO CREATE KK
International Classes:
G01R23/20; G01R31/00; G01R31/08; H02J3/01; G01R21/00; (IPC1-7): G01R31/00; G01R21/00; G01R23/20; G01R31/08; H02J3/01
Attorney, Agent or Firm:
Tamio Nishiwaki (1 person outside)