Title:
HATCHING EGG INSPECTION DEVICE, METHOD FOR SPECIFICATION, AND SPECIFICATION PROGRAM
Document Type and Number:
Japanese Patent JP2020204570
Kind Code:
A
Abstract:
To provide a technique for specifying a group of hatching eggs more precisely.SOLUTION: The hatching egg inspection device of the present invention includes: a light emitting unit for irradiating a hatching egg as an inspection target with light; a light reception unit for receiving light which was emitted from the light emitting unit and penetrated the hatching egg; an acquisition unit for acquiring information obtained from the hatching egg or from the outside of the hatching egg other than the light received by the light reception unit; and a grouping unit for specifying the group of the hatching egg from the light received by the light reception unit and the information acquired by the acquisition unit.SELECTED DRAWING: Figure 6
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Inventors:
OHASHI TOYOAKI
FUJITANI SHINICHI
FUJITANI SHINICHI
Application Number:
JP2019112995A
Publication Date:
December 24, 2020
Filing Date:
June 18, 2019
Export Citation:
Assignee:
NABERU KK
International Classes:
G01N21/59; A01K43/00; G01N33/08; G06N20/00
Domestic Patent References:
| JP2011177188A | 2011-09-15 | |||
| JP2017227471A | 2017-12-28 | |||
| JP2015035963A | 2015-02-23 |
Other References:
GENG, L. ET AL.: "End-to-End Multimodal 16-Day Hatching Eggs Classification", SYMMETRY, vol. Vol.11, 759, JPN6023007017, 4 June 2019 (2019-06-04), pages 1 - 14, ISSN: 0004994960
Attorney, Agent or Firm:
Fukami patent office