Title:
HEAT RADIATION MEASURING APPARATUS
Document Type and Number:
Japanese Patent JPH02228528
Kind Code:
A
Abstract:
PURPOSE:To measure an emissivity of a sample near a normal temperature simply and accurately by enabling measuring of light from a sample with the turning of a changeover mirror to keep the sample at a specified temperature with a sample heating furnace. CONSTITUTION:A changeover mirror 5A is turned so that light from a sample S can be measured and then, a measurement is started. At this point, the sample S is kept at a specified temperature with a sample heating furnace 2. Then, a shielding wall 3 is heated with a temperature control system 4 to measure the current power spectrum with an FTIR measuring system 6 and a measuring data is stored into a data processing system 7. Then, the shielding wall 3 is heated with the temperature control system 4 to measure the current power spectrum with the measuring system 6 and a data processing system 7 in which a measuring data thereof is stored computes the power spectrum of the sample S from a measured value stored. Moreover, a heat emissivity of the sample near a normal temperature is determined.
Inventors:
NISHIDA MASANAO
TSUJI SHIRO
TSUJI SHIRO
Application Number:
JP5075889A
Publication Date:
September 11, 1990
Filing Date:
March 02, 1989
Export Citation:
Assignee:
SHIMADZU CORP
International Classes:
G01J5/00; (IPC1-7): G01J5/00
Domestic Patent References:
| JPS6033380U | 1985-03-07 | |||
| JPS61255060A | 1986-11-12 | |||
| JPS5750628A | 1982-03-25 |
Attorney, Agent or Firm:
Prefecture Kosuke
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